Kolmogorov Width of Classes of Smooth Functions on the Sphere

Let ^d−1{(x₁,…,x_d) ^d:x²₁+···+x²_d=1} be the unit sphere of the d-dimensional Euclidean space ^d. For r>0, we denote by B^r_p (1p∞) the class of functions f on ^d−1 representable in the formwhere dσ(y) denotes the usual Lebesgue measure on ^d−1, and P^λ_k(t) is the ultraspherical polynomial.For 1p,q∞, the Kolmogorov N-width of B^r_p in L^q( ^d−1) is given bythe left-most infimum being taken over all N-dimensional subspaces X_N of L^q( ^d−1).The main result in this paper is that for r2(d−1)²,where A_NB_N means that there exists a positive constant C, independent of N, such that C⁻¹A_NB_NCA_N.This extends the well-known Kashin theorem on the asymptotic order of the Kolmogorov widths of the Sobolev class of the periodic functions.     

差分吸收光谱法测量大气痕量气体浓度误差分析及改善方法

差分吸收光谱技术(DOAS)中采用线性最小二乘拟合方法,用痕量气体标准差分吸收截面对测量得到的差分吸收光谱进行拟合,得出大气中痕量气体的浓度.计算结果的准确性不仅取决于光谱的测量精度,而且受标准差分吸收截面以及仪器函数和温度等诸多因素的影响.详细地分析了计算误差的产生原因,提出了用高浓度样品池得到标准吸收截面的方法,针对光谱固有结构,以及温度对标准吸收截面的影响,改进了浓度反演算法.大量的实验表明,综合运用上述方法,即便对低浓度的样气,相对测量误差也能降低到10%以下.     

Regular Balanced Cayley Maps for Cyclic, Dihedral and Generalized Quaternion Groups

A Cayley map is a Cayley graph embedded in an orientable surface such that. the local rotations at every vertex are identical. In this paper, balanced regular Cayley maps for cyclic groups, dihedral groups, and generalized quaternion groups are classified.     

On oriented 2-factorable graphs

Oriented 2-factorable graphs are reduced to bouquets by permutation voltage assignment in this paper. Introducing the concept ofk-class index of a permutation group, various oriented 2-factorable graphs are enumerated in this paper.     

OADM环网的实验研究

研究了光分插复用器(OADM)的关键技术,重点分析了相关的实现技术,完成了利用OADM构建全光环网的实验研究,给出了重要的实验数据,包括眼图、光谱图、光信噪比、保护与恢复等,并对这些实验数据进行了分析,为光传送网的设计与构建提供了重要的参考依据.     

CFD在燃煤细粒子凝聚过程中的应用

燃煤产生的细粒子富集了大量的有毒痕量元素,对大气环境和人类健康造成严重危害。本文针对燃煤细粒子的形成过程,在计算流体力学(CFD)的基础上,结合气溶胶动力学理论,模拟了烟气中细粒子在圆柱形流场中由于碰撞而凝聚的过程,并通过计算结果分析细粒子颗粒特征参量(速度、质量、直径和颗粒数目)随流场的变化趋势,为深入研究燃煤细粒子的形成演化机理提供理论基础。     

基于园区网络的主动安全模型设计与研究

从现行典型园区网络安全设计方案入手，结合其在安全防范解决方案上存在的问题，提出了一种网络主动安全模型；在全局网络安全认识的基础上．阐述了模型组成部件的功能定义和网络主动安全实现流程；采用统一网络入口认证、网络知识发现及资源有效控制、沟通等手段，解决了现行网络安全设计中存在的恶意攻击行为源头定位困难，以及信息安全司法取证不准、网络资源安全被动防护、网络灾难快速反映能力差等问题．实验结果表明，该设计方案具有较好的可行性和实用性．     

Resistivity－temperature characteristics of sol gel YBa2Cu3Oy samples synthesized in flowing oxygen atmosphere

The relationship of resistivity versus synthesizing temperature of sol gel YBa_2Cu_3O_y samples was studied when prepared under flowing oxygen conditions. A set of high-temperature ρ－T curves was obtained for the whole process. After the sample finished the test measuring, its resistivity was ρ_{300}=9.83×10^{-3 }Ω·cm at room temperature. The ρ－T curve also showed that the orthorhombic－tetragonal phase transformation of sol-gel YBa_2Cu_3O_y sample occurred at 581℃ for the sample in the rising temperature process, but at 613℃ in the cooling process, lower than that of the samples made by using the conventional powder metallurgy methods.     

WEIGHTED APPROXIMATION ON SZASZ—TYPE OPERATORS

In this paper, we use weighted modules ω(?)(f,t)w to study the pointwise approximation on Szasz-type operators, and obtain the direct and converse theorem, as well as characterizations of the pointwise approximation of Jacobi-weighted Szasz-type operators.     

Multi-layer thin films/substrate system subjected to non-uniform misfit strains

Current methodologies used for the inference of thin film stress through curvature measurement are strictly restricted to stress and curvature states that are assumed to remain uniform over the entire film/substrate system. These methodologies have recently been extended to a single layer of thin film deposited on a substrate subjected to the non-uniform misfit strain in the thin film. Such methodologies are further extended to multi-layer thin films deposited on a substrate in the present study. Each thin film may have its own non-uniform misfit strain. We derive relations between the stresses in each thin film and the change of system curvatures due to the deposition of each thin film. The interface shear stresses between the adjacent films and between the thin film and the substrate are also obtained from the system curvatures. This provides the basis for the experimental determination of thin film stresses in multi-layer thin films on a substrate.